Yuri Plotnikov, Ph.D.
17 years at GE Global Research Center; designed automatic inspections systems using eddy current arrays; designed image processing for crack detection with infrared thermography using inductive heating; researched numerical modeling, theoretical and experimental research of magnetic resonance imaging, transient eddy current techniques, advanced sensors, sensor array technologies, and image processing
Ph.D. in Technical Sciences, Moscow Power Engineering Institute; Joint B.S./M.S. Electrical Engineering, Moscow Power Engineering Institute