Dr. Yuri Plotnikov joined CCAM in May, 2017 as an Adaptive Automation Researcher focusing on advanced sensing and inspection automation. He spent 17 years at GE Global Research Center where he led R&D of new measurement methods, probes, arrays, instruments, and signal analysis as it applies to high performance materials, components, and structures. He led projects on development, engineering, prototyping and implementing various techniques with a focus on electromagnetics (pulsed eddy current, microwave, terahertz), infrared thermography, acoustic emission, and ultrasound. He developed new approaches for sensors, signal and image processing implemented in automatic inspection systems using eddy current arrays and inspection system using infrared thermography for delamination and crack detection.
Dr. Plotnikov received his Ph.D. in Technical Sciences and a joint B.S./M.S. in Electrical Engineering from the Moscow Power Engineering Institute. He has presented his work at over 25 international conferences and workshops. He is author/coauthor of 50 papers in scientific journals and conference proceedings. He holds 26 U.S. patents.
In his free time he mentors student participants in FIRST Tech Challenge, and Science Bowl. He enjoys playing soccer and volleyball.